In plain words

Two ways to put a number on how strongly a material resists a current. Resistivity belongs to the material itself, whatever the size of the piece: copper’s is tiny, glass’s enormous. For a sheet so thin that its thickness is hard to pin down, the sheet resistance is used instead: the resistance of a square of it, measured from one edge to the opposite one, which comes out the same for a square of any size. It is quoted in ohms per square.

Going deeper

Three panels. Resistivity: a bar of length L and cross-section A, whose resistance is the resistivity times L divided by A. Sheet resistance: a small and a large square of film with contacts on opposite edges have the same resistance, and a strip three squares long has three times the sheet resistance. Four probes: a strip with current contacts at its ends and two voltage contacts on its side, connected to a voltmeter. resistivity: the material length L area A resistance = ρ × L ÷ A a property of the material, whatever the size of the piece copper tiny, glass enormous sheet: ohms per square any square: the same 3 squares a strip L long and W wide: sheet resistance × L ÷ W the natural number for a monolayer four probes, not two V current in and out at the ends the inner pair carries no current, so their contacts add nothing only the sample is measured
Resistivity belongs to the material; the resistance of a piece follows from its length and cross-section. For a thin film the resistance of any square is the same, so a film is described by its sheet resistance in ohms per square. Both are measured with four contacts: current through the outer pair, voltage across an inner pair that carries no current.

Why ohms per square

A strip of film twice as long has twice the resistance; twice as wide, half. So a strip exactly as long as it is wide has the same resistance whether it is a micrometre or a metre across, and that value describes the film. A device’s resistance is then the sheet resistance times its number of squares, the length divided by the width.

For a the sheet resistance is the meaningful number. Turning it into a resistivity needs a thickness, and the thickness of a single layer is a matter of convention – usually the layer spacing of the bulk crystal – so resistivities quoted for monolayers carry that assumption. Combined with the it gives the : graphene with 1012 carriers per cm2 and a sheet resistance of 1 kΩ per square has a mobility of about 6,000 cm2/Vs.

Four probes, not two

Measured with two contacts, the resistance includes the contacts themselves, which in 2D devices can exceed that of the channel. Four contacts separate them: a current is driven through the outer pair, and the voltage is read by an inner pair that carries no current, so their own resistance does not matter. The arrangement goes back to Wenner’s measurements of the earth’s resistivity in 1915 and was taken up for in the 1950s; in thin it takes the form of a , whose side contacts also give the Hall voltage.

For samples of irregular shape, van der Pauw showed in 1958 that four small contacts anywhere on the edge of a uniform sheet without holes are enough: two measurements with the contacts swapped round give the sheet resistance exactly. The conditions matter – small contacts, at the edge, on a uniform film – and flakes with cracks, bubbles or uneven doping break them without any visible sign.

What the numbers mean

Copper has a resistivity of about 1.7 µΩ·cm and glass one at least 1018 times higher; semiconductors span the range in between according to their doping. Transparent electrodes are judged by sheet resistance at a given transparency: indium tin oxide reaches some tens of ohms per square at about 90 percent transmission, and doped graphene has reached about 30 ohms per square at a similar transparency, though not yet cheaply and stably over large areas. Reduced graphene oxide stays between hundreds and tens of thousands of ohms per square.

The change with temperature says more than any single value. Resistivity that falls on cooling and then levels off marks a metal, and the ratio between room temperature and the lowest temperature measures how clean it is; resistivity that rises marks an or semiconductor; kinks and jumps mark , such as the onset of a or of .

For specialists

Resistivity ρ relates electric field to current density, in Ω·m or Ω·cm, so that a bar of length L and cross-section A has resistance ρL/A. For a film of thickness t the sheet resistance is ρ/t, quoted in Ω per square, and a strip L long and W wide has the sheet resistance times L/W. For an atomically thin layer it is the natural quantity, since the thickness is a convention, and it equals 1/neμ for sheet density n and mobility μ. Both are measured with four probes – a Hall bar, a collinear four-point probe or the van der Pauw method for arbitrary shapes – so that the voltage is sensed away from the current contacts and the drops out.

Where this comes from

  1. A method of measuring specific resistivity and Hall effect of discs of arbitrary shape van der Pauw · Philips Research Reports 13, 1 (1958)
  2. The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems Miccoli et al. · Journal of Physics: Condensed Matter 27, 223201 (2015)
  3. Roll-to-roll production of 30-inch graphene films for transparent electrodes Bae et al. · Nature Nanotechnology 5, 574 (2010)