In plain words

The electrical resistance where a metal wire meets the material it is meant to feed current into. In devices made from it often wastes more than the material itself.

Going deeper

Left: a band diagram where a metal meets a semiconductor, with a barrier between the metal Fermi level and the semiconductor band edge; below it, a device cross-section with two metal contacts on a 2D channel. Right: a transfer-length measurement – total resistance against channel length falls on a straight line whose slope is the channel and whose intercept at zero length is twice the contact resistance. where the current has to get in metal band edge Fermi level barrier contact contact channel quoted per micrometre of contact width measuring it: vary the channel length total resistance channel length intercept: twice the contact resistance slope: the channel itself semimetal contacts approach a few tens of Ω·µm
Current entering a 2D channel has to cross the metal–semiconductor interface, and the resistance of that crossing is quoted per micrometre of contact width. Measuring devices of several channel lengths separates it from the channel: the intercept at zero length is twice the contact resistance.

Why the contact dominates

In a 2D the channel itself may contribute only a few hundred ohms per micrometre, while the two contacts contribute more. The current has to pass from a three-dimensional metal into a layer less than a nanometre thick, and at that junction a usually forms. Worse, the barrier height often refuses to follow the metal work function: states induced in the gap by the metal pin the near a fixed position, so choosing a different metal changes less than simple theory predicts.

Because resistance scales with contact width, the figure of merit is quoted in ohm-micrometres. For 2D devices to compete with silicon, values around 100 Ω·µm or below are needed.

What has helped

Several routes lower the barrier or bypass it. such as bismuth and antimony have no states to induce a strong pinning and can be deposited gently, which brought MoS2 contacts down towards the limit set by the number of conducting modes in the channel – a few tens of Ω·µm for a monolayer. the semiconductor under the contact thins the barrier so carriers tunnel through it. Phase-engineered contacts convert the region under the metal to a metallic . contacts, where a metal film is rather than evaporated, avoid the damage and gap states that evaporation creates.

Edge contacts, standard for graphene in hBN, make a one-dimensional bond along the edge and give low, reproducible resistance.

Measuring it properly

The fabricates devices with several channel lengths and plots total resistance against length. The slope gives the of the channel, the intercept twice the contact resistance, and a second intercept gives the transfer length – the distance over which current crosses into the channel. Four-probe measurements provide the same separation on a single device.

Numbers deserve scrutiny. Contact resistance depends on carrier density, so it must be quoted at a stated or sheet density, and it usually falls as the channel is doped harder. Values extracted at low temperature look better than room-temperature ones, and a barrier can make two-terminal resistance vary with bias, so a single number without its conditions says little.

For specialists

Resistance at the metal–semiconductor junction normalised to contact width; the key figure of merit for 2D transistor contacts.

Where this comes from

  1. Ultralow contact resistance between semimetal and monolayer semiconductors Shen et al. · Nature 593, 211 (2021) cited by 1,414
  2. Approaching the quantum limit in two-dimensional semiconductor contacts Li et al. · Nature 613, 274 (2023) cited by 620