Charge carrier mobility

Also called carrier mobility

Everyday term

In plain words

How easily electrons, or the gaps they leave behind (holes), move through a material when pushed by a voltage. Higher mobility means faster, more efficient electronics – but it is easily ruined by dirt, defects and a poor .

Going deeper

Left: log mobility against log temperature. A flat dashed line marks the limit from impurities, a falling dashed line the limit from phonons, and the measured solid curve follows the lower of the two, flat at low temperature and falling at high temperature. Right: a two-terminal device where current and voltage share the same two contacts, and a Hall bar where current flows through the end contacts and voltage is read between side probes along the channel. what limits mobility mobility (log) temperature (log) impurities phonons measured (solid): 1/μ = 1/μ_imp + 1/μ_ph two ways to measure it two-terminal I,V I,V contact resistance counted in Hall bar, four-probe I I V current through the ends, voltage between side probes: no contacts
Scattering mechanisms add up: the inverse mobilities from impurities and from phonons sum, so the lower limit wins at each temperature. How the device is wired decides whether the contacts are counted as part of the material – in a two-terminal measurement they are, in a Hall bar they are not.

What mobility measures

Conductivity is the product of how many carriers there are, their charge and how freely they move: σ = n·e·μ. Mobility is the last factor, the drift velocity per unit electric field, quoted in cm2/V·s. In a simple picture it equals e·τ/m, where τ is the average time between scattering events and m the , so light carriers that scatter rarely are the most mobile.

That is one reason the numbers differ so much between materials. Electrons in MoS2 are relatively heavy, about half the free-electron mass, and couple strongly to ; graphene’s carriers behave as if nearly and couple weakly. For scale, electrons in bulk silicon reach about 1400 cm2/V·s at room temperature, but in the thin channels of modern they reach only a few hundred.

What limits it

Scattering rates from independent sources add up, so the inverse mobilities add – Matthiessen’s rule. At low temperature, charged impurities, defects, surface roughness and charge traps in the substrate dominate, and the mobility there is a good measure of how clean a sample is. At higher temperature, phonons take over: the material’s own lattice vibrations, and also remote phonons from polar such as SiO2 or HfO2, whose vibrating charges reach into an atomically thin channel.

The room-temperature value is the one that matters for devices, and phonons set a ceiling that cleaning cannot lift – calculations put it at a few hundred cm2/V·s for MoS2. hBN- graphene comes close to its own, far higher, phonon limit.

Measuring it without fooling yourself

Field-effect mobility is taken from the slope of a transistor’s transfer curve. It is quick, but depends on the gate capacitance assumed and, in a two-terminal device, on the contacts: contacts can make mobility look gate-dependent, and in some geometries can even make it appear higher than it is. is more direct. A Hall bar gives the from the Hall voltage in a magnetic field and the conductivity from a measurement between side contacts, so the contacts drop out.

A mobility means little without its context: the carrier density and temperature at which it was measured, the method, and whether it is a typical device or the best of many. A single peak value from a two-terminal curve is the least reliable number of all.

For specialists

Drift velocity per unit electric field, usually quoted in cm2/V·s. In it is limited intrinsically by phonon scattering and extrinsically by charged impurities, roughness, remote phonons and ; field-effect values extracted from two-terminal devices can be distorted by .

Where this comes from

  1. Ultrahigh electron mobility in suspended graphene Bolotin et al. · Solid State Communications 146, 351 (2008) cited by 8,087