In plain words

Heating a material for a while, well below its melting point, so that its atoms can move a little. It drives off water and dirt, removes some of the plastic left behind when a layer is , and lets defects heal or a film settle into a more ordered crystal. For it is a double-edged tool: a gentle anneal cleans a device, but too much heat can rotate stacked layers, oxidise crystals or pull atoms out of the surface.

As the site uses it

Control SrTiO3 termination by etching and annealing, and count LaAlO3 unit cells from RHEED oscillations.

LaAlO3/SrTiO3 · Oxide interface electron gases

Quote the oxygen partial pressure and the annealing history with every mobility.

SnO · Tin monoxide

Going deeper

Left: temperature against time for a typical anneal after transfer – a ramp, a hold at 200–400 °C for an hour or more in vacuum or argon–hydrogen, and a cool-down. Right: a temperature scale from room temperature upwards: near 100 °C water and loosely bound molecules leave; between 200 and 400 °C polymer residue breaks down, trapped bubbles merge and metal contacts improve; a dashed line at about 400 °C marks the limit once a chip is wired; hotter still, stacks rotate, chalcogen atoms leave and air-sensitive crystals oxidise. a typical anneal after transfer temperature time ramp hold at 200–400 °C an hour or more, in vacuum or Ar/H₂ cool what the heat does 25 °C 100 200 400 water and loosely bound molecules leave polymer residue breaks down, trapped bubbles merge, metal contacts improve ≈ 400 °C: the limit once a chip is wired hotter: stacks rotate, chalcogens leave, air-sensitive crystals oxidise
An anneal is a ramp, a hold and a cool-down. Up to a few hundred degrees it cleans and settles a device; beyond that it starts to undo the work, and a chip that already carries its wiring sets a ceiling of about 400 °C.

Cleaning after transfer

Every transfer leaves something behind: the polymer that carried the layer, solvent, and water and hydrocarbons from the air. Heating to 200–400 °C in vacuum or in a mixture of argon and hydrogen drives off the water and decomposes much of the polymer, which made it a standard step after transfer from the early graphene work on. It does not remove everything: some residue chars into carbon that stays, and the cleaner sheet settles closer to its – on silicon oxide, graphene annealed this way picks up strong from the oxide below.

In stacks of crystals the heat helps in another way. Contamination trapped between the layers gathers into bubbles, leaving clean interface between them, and annealing lets small bubbles move and merge, which opens up larger clean areas.

Healing and harming

Heated in sulfur or selenium vapour, a can fill some of the it was grown with; heated in vacuum, it can lose more of them. Oxides behave the same way with oxygen, which is why oxide films are annealed in oxygen to set how many they keep. A short anneal after the metal goes on also lowers , by improving the contact between metal and channel.

The risks grow with temperature. Twisted stacks relax towards aligned stacking, so twisted devices are kept cool; air-sensitive crystals such as black phosphorus oxidise faster; and a chip that already carries its wiring tolerates only about 400 °C, which limits what can be done once 2D layers are added to finished circuits.

For specialists

Thermal treatment below the melting or decomposition temperature – in vacuum, inert gas, forming gas (Ar/H2) or a or oxygen atmosphere – used to desorb adsorbates, decompose polymer residues after transfer, lower contact resistance, heal vacancies and recrystallise grown films. Post-transfer anneals typically run at 200–400 °C; relaxation, oxidation, chalcogen loss and the back-end set the upper limit.

Where this comes from

  1. Atomic structure of graphene on SiO2 Ishigami et al. · Nano Letters 7, 1643 (2007)
  2. Toward intrinsic graphene surfaces: a systematic study on thermal annealing and wet-chemical treatment of SiO2-supported graphene devices Cheng et al. · Nano Letters 11, 767 (2011)
  3. Graphene annealing: how clean can it be? Lin et al. · Nano Letters 12, 414 (2012)