In plain words

A tip on a tiny springy arm is moved across a surface and its bending is measured, mapping height point by point – much as a fingertip reads Braille. It works on anything, conducting or not, which is why it is the routine way to check how thick a is.

Going deeper

Left: an AFM cantilever with a sharp tip scanning over a substrate with a flake on it; a laser beam reflects from the back of the cantilever onto a four-segment photodiode. Right: a height profile across a graphene edge. A dashed step marks the true single-layer thickness of 0.34 nm; a solid step, much taller, shows that tapping-mode measurements can add up to about 1 nm. a tip on a cantilever laser photodiode cantilever flake substrate the tip follows the surface; the laser spot moves as the cantilever bends height across a graphene edge height position across the edge tapping mode can add up to ~1 nm one graphene layer: 0.34 nm calibrate on steps within the flake itself
AFM measures height by feeling the surface with a tip, so it works on insulators and conductors alike. The apparent height of a monolayer is not its crystallographic thickness: in tapping mode, poorly chosen settings can add up to about a nanometre to a graphene step.

How it measures

The atomic force microscope, introduced by Binnig, Quate and Gerber in 1986, scans a sharp tip on a flexible cantilever across a surface. A laser reflected from the back of the cantilever onto a segmented detects tiny deflections, and a feedback loop moves the sample or tip to keep the interaction constant, recording height at every point.

In contact mode the tip touches the surface continuously. In tapping, or intermittent-contact, mode the cantilever oscillates near resonance and the feedback holds its amplitude constant, which is gentler on soft samples and loose flakes. Vertical noise can be well below an ångström, while lateral resolution is limited by the tip radius, typically several nanometres. Unlike tunnelling microscopy, AFM needs no electrical conduction.

Why a monolayer rarely measures its true thickness

Graphene layers are 0.34 nm apart, yet on silicon oxide are routinely reported between about 0.4 and 1 nm. The tip interacts differently with the flake and with the , water and adsorbates can sit underneath the flake, and in tapping mode the chosen free amplitude and set-point change how hard the tip presses on each surface. A systematic study found that poorly chosen amplitudes can add as much as a nanometre to the measured height.

The reliable part of a measurement is the step between terraces within the same flake, where tip and material are unchanged. Layer counts are best confirmed with an independent method such as or , and the mode and settings reported with any thickness.

More than height

Variants of AFM map far more than topography. Kelvin probe force microscopy measures surface potential, revealing , differences and layer number. Conductive AFM maps local current through a flake. Piezoresponse force microscopy images and domains. Lateral force microscopy shows contrast that can distinguish crystal orientations and stacking domains, and phase images separate materials by how they dissipate energy.

The tip is also a tool. Pressing on suspended measures stiffness and breaking strength, and scanning in contact mode can sweep from a device surface. Tips wear and pick up contamination, and a blunt tip broadens narrow features, so sharp edges and small particles always look wider than they are.

For specialists

Force microscopy in contact, tapping or non-contact mode, used for thickness, roughness, bubbles and polymer residue, with variants for surface potential (KPFM) and local conductivity (c-AFM). Apparent height is not the crystallographic thickness: the tip interacts differently with flake and substrate, so a monolayer commonly reads between 0.4 and 1 nm. Quote the mode, and calibrate against a step of known height.

Where this comes from

  1. Atomic force microscope Binnig et al. · Physical Review Letters 56, 930 (1986) cited by 14,730
  2. Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy Nemes-Incze et al. · Carbon 46, 1435 (2008) cited by 609