In plain words

Sealing a delicate between protective layers so that air, water and dirt cannot reach it. Wrapping it in boron nitride, itself a 2D material, is the standard way to get the cleanest results.

Going deeper

Left: a 2D layer lying on rough silicon oxide that contains positive and negative trapped charges, with water, oxygen and hydrocarbon molecules adsorbed on top. Right: the same layer sealed between two flat hBN layers on a substrate, with a small bubble of trapped residue and metal contacts touching the etched edges of the stack. bare, on silicon oxide every atom is at the surface: oxide roughness and trapped charges scatter carriers and dope the layer unevenly, while molecules from the air adsorb on top – or react with it adsorbed water, oxygen, hydrocarbons 2D layer + − + − rough oxide with trapped charges encapsulated in hBN, edge-contacted boron nitride above and below: flat, inert, and free of charged traps. Contacts reach the layer through its etched edge. substrate hBN hBN 2D layer residue collects in bubbles edge contact
A bare layer on oxide feels roughness, charged traps and molecules from the air on both faces. Sandwiched between hexagonal boron nitride it sees flat, inert, charge-free surfaces instead; leftover residue gathers into bubbles, and the sealed layer is contacted through its etched edge.

What a bare layer is exposed to

In a every atom is a surface atom, so the surroundings act on all of it. Silicon oxide, the usual , is rough on the atomic scale and carries trapped charges and ; they scatter carriers and dope the layer unevenly, so graphene on oxide breaks up into puddles of . From above, water, oxygen and hydrocarbons from the air adsorb and dope the layer further. Some materials do not merely adsorb but react: black phosphorus, CrI3 and many tellurides degrade within minutes to days in air, especially under light. Encapsulation deals with both faces at once.

Why boron nitride works so well

Hexagonal boron nitride is an with a gap of about 6 eV, it is atomically flat, and its surface has no dangling bonds and few charged impurities. Its lattice is also close to graphene’s, about 1.8% larger. Graphene laid on hBN rather than oxide showed and uniformity almost an order of magnitude better, and graphene fully sealed in hBN and contacted through its edge reached room-temperature mobilities close to the limit set by alone.

Stacking has a useful side effect: contamination trapped between layers gathers into bubbles and leaves the regions between them atomically clean, so devices are placed in bubble-free areas. Because the top surface is covered, contacts are made through the edge or through holes opened in the top layer.

Other seals and their limits

Exfoliated hBN comes as small , which suits research devices but not . Larger areas are covered with oxides such as Al2O3 grown by , with polymers, or with -grown hBN. Each protects less well and adds of its own; atomic layer deposition, for example, nucleates poorly on a clean 2D surface and can leave pinholes or dope the layer unless a seed layer is used.

Encapsulation also locks in whatever is present when it is applied: adsorbed water or from transfer stays in the device. This is why crystals are exfoliated and stacked in a glovebox, and why the quality of a sealed device is fixed at assembly rather than improved afterwards.

For specialists

Enclosure of a 2D layer between barrier layers – most often hexagonal boron nitride for the highest quality, or deposited oxides and polymers for larger areas – to suppress oxidation, adsorbates, charge disorder and substrate roughness. It also seals in whatever contamination was present when it was applied.

Where this comes from

  1. Boron nitride substrates for high-quality graphene electronics Dean et al. · Nature Nanotechnology 5, 722 (2010) cited by 7,165
  2. One-dimensional electrical contact to a two-dimensional material Wang et al. · Science 342, 614 (2013) cited by 3,074
  3. Hexagonal boron nitride is an indirect bandgap semiconductor Cassabois, Valvin and Gil · Nature Photonics 10, 262 (2016) cited by 1,413