In plain words

An electrical used for what it does in an electric field rather than for carrying current – the thin layer inside a capacitor, or the insulator that separates a ’s gate from its channel. A good dielectric blocks current completely, withstands a strong field without breaking down and, for gates, has a high , so that a voltage on the gate pulls many charges into the channel. For 2D transistors the dielectric is as hard to get right as the 2D layer itself.

Going deeper

Three panels. A capacitor: an insulating slab between a positive and a negative plate, its molecules polarised into small dipoles. A gate stack: a transistor cross-section with gate metal on top of a dielectric layer, over a 2D channel on a substrate. What can go wrong: traps at the interface between dielectric and channel, a leakage path and a breakdown path through the dielectric. a capacitor −+−+−+−+−+−+−+−+−+−+ + − the insulator polarises, storing more charge no current flows through it; a higher permittivity κ holds more charge per volt a gate stack gate dielectric 2D channel substrate thin and high-κ: strong gate control hBN for clean interfaces, oxides for high κ: neither does everything yet what can go wrong traps at the interface, leakage, breakdown hysteresis, drifting thresholds and failure: reliability decides whether it can go into products
A dielectric blocks current but polarises in an electric field, so a capacitor stores more charge with it than without. In a transistor it separates the gate from the 2D channel, where it should be thin, high in permittivity and free of traps; leakage, trapped charge and breakdown are what make it fail.

Blocking current, passing the field

Put an insulator between the plates of a capacitor and it polarises: its electrons shift slightly against its nuclei, or its ions against each other, and the field inside is partly cancelled. More charge can then be stored at the same voltage, by a factor called the permittivity or dielectric constant, κ. In a transistor the dielectric is the layer between gate and channel, and the charge a pulls into the channel grows with κ and falls with the thickness.

Silicon technology thinned its silicon dioxide gate insulator until it was barely a nanometre thick and electrons began to tunnel straight through it. From 2007 hafnium-based oxides, with five to six times the permittivity, took over: physically thicker, so they leak less, yet electrically as effective as a much thinner layer of silicon dioxide.

What a 2D channel needs

A 2D channel is all surface, so whatever touches it matters. The ideal dielectric would be thin, high in κ, free of charged defects and bonded to the channel without disturbing it. hBN comes closest on the last points: placing graphene on hBN instead of silicon dioxide improved its almost tenfold, because hBN is flat, inert and nearly free of trapped charge. But its permittivity is low, and growth of hBN of high quality is still difficult.

The usual industrial route, of oxides, struggles because the basal planes of offer nothing to bond to. Researchers therefore try seed layers, crystalline fluorides such as CaF2 that meet the channel through a clean interface, and oxides grown from the material itself, such as Bi2SeO5 formed on Bi2O2Se.

Judged by reliability

A dielectric that works in one measurement can still fail in a product. Charge trapped in the oxide or at its interface shifts the and causes ; under long stress at operating voltage and temperature, thresholds drift and the layer eventually breaks down. Industry judges dielectrics by statistics over many devices and by accelerated lifetime tests, and that is where many 2D gate stacks reported with excellent single devices are still weakest.

For specialists

An insulator characterised by its permittivity κ, and to the channel, breakdown field, leakage, and density of fixed charge and traps at the interface and in the bulk (border traps). Silicon technology moved from SiO2 (κ ≈ 3.9) to hafnium-based oxides (κ ≈ 20–25) to keep gate control at sub-nanometre equivalent oxide thickness. For 2D channels, hBN gives clean, trap-poor interfaces but a low κ of about 3–4 and is hard to grow at wafer scale; ALD oxides nucleate poorly on basal planes; alternatives include crystalline CaF2, native oxides such as Bi2SeO5 on Bi2O2Se, and molecular crystals. Reliability – hysteresis, bias-temperature instability and time-dependent breakdown – is the yardstick for any dielectric meant for products.

Where this comes from

  1. High dielectric constant oxides Robertson · European Physical Journal Applied Physics 28, 265 (2004)
  2. Boron nitride substrates for high-quality graphene electronics Dean et al. · Nature Nanotechnology 5, 722 (2010) cited by 7,165
  3. Insulators for 2D nanoelectronics: the gap to bridge Illarionov et al. · Nature Communications 11, 3385 (2020) cited by 559
  4. A native oxide high-κ gate dielectric for two-dimensional electronics Li et al. · Nature Electronics 3, 473 (2020) cited by 306